Consultation Overview
Rutherford Back-Scattering (RBS)
This service offers non-destructive, high-precision quantification of elemental composition and thickness for thin-film stacks. Utilizing MeV-range ion beam analysis, RBS provides absolute atomic concentrations (stoichiometry) and depth-resolved density profiles without the need for external calibration standards.
Primary Deliverables:
Absolute Stoichiometric Analysis: Quantification of the atomic ratios across the film to verify chemical consistency and phase purity.
Depth-Resolved Composition Profiles: A graphical map of elemental concentration vs. depth to identify oxidation, contamination, or interface gradients.
Non-Destructive Thickness Verification: Validation of layer thicknesses and interface sharpness across single and multi-layer stacks.
Service Details
What's Included
- Video consultation
- Personalized guidance and advice
- Session notes and recommendations
- Follow-up support via email
Pricing Options
- Single Session ₹500
- Full Project ₹3,000
About Khushboo Shah
I am a physicist transitioning from an intensive academic research phase into high-impact professional roles. My work has been centered on the synthesis and characterization of advanced thin films, specifically focusing on the interface between metal silicides and semiconductor substrates. I can provide expert mentorship in thin film physics and high-end characterizations basics. I offer high-level scientific writing, analytical thinking, and research-to-career guidance for students.
Experience
Scientific Writing
Specialized expertise in scientific writing with 3 years of professional experience.